Inch-size Cs3Bi2I9 polycrystalline wafers with near-intrinsic properties for ultra low-detection limit X-ray detection
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作者:Nuo Bu, Shanshan Jia, Yingrui Xiao, Haojin Li, Nan Li,a Xinmei Liu, Zhou Yang, * Kui Zhao,* Shengzhong (Frank) Liu*
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发布时间: 1097天前
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1190 次浏览
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Nuo Bu, Shanshan Jia, Yingrui Xiao, Haojin Li, Nan Li,a Xinmei Liu, Zhou Yang, * Kui Zhao,* Shengzhong (Frank) Liu,* J. Mater. Chem. C, 2022,10, 6665-6672.
Nuo Bu,a Shanshan Jia,a Yingrui Xiao,a Haojin Li,a Nan Li,a Xinmei Liu,a
Zhou Yang, *a Kui Zhao *a and Shengzhong (Frank) Liu *
ABSTRACT:
Lead-free perovskites are promising for next-generation bio-friendly X-ray detector materials, while it
remains a challenge to fabricate high-quality wafers at a macroscopic scale using a readily scalable
method. Herein, a solvent-free mechanochemical fabrication method is developed to produce inch-size
lead-free perovskite Cs3Bi2I9 crystalline-wafers. It is surprising to see that these polycrystalline wafers
exhibit near-intrinsic properties, and more specifically, the apparent trap density is measured to be as
low as 5.26 1010 cm3, essentially the same as that of their single-crystal counterparts. Therefore, the
X-ray detector fabricated on the Cs3Bi2I9 wafer delivers high sensitivity up to 230.46 19.86 mC Gyair1 cm2
and a detection limit as low as 61.25 nGyair s1 under a 40 kV X-ray source and 40 V mm1 electric field. This
research provides a readily scalable method for fabricating large perovskite wafers with near-intrinsic properties
for general commercial applications.
https://doi.org/
10.1039/d2tc00599a